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NE1619 heceta 4 temperature and voltage monitor product data supersedes data of 2000 jul 13 2001 aug 29 integrated circuits
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2 2001 aug 29 853-2202 27010 general description the NE1619 is designed for monitoring the temperatures and supply voltages of microprocessor-based systems by measuring those parameters and comparing the readings with programmable limits. the device provides five possible analog inputs, a remote temperature sensor input and on-board local temperature sensor. the device also monitors its own power supply and provides digital inputs for the pentium/pro power supply id code. the device communicates with the system controller via an smbus (system management bus) by which it can be programmed for operation and data collection. readings come from conversions of the on-board a-to-d converter which cycles through all measurements in sequence in approximately one second when the conversion is started. the device includes a number of registers to store data of the device configuration, status, readings and limits. except for the temperature-related data which are in 8-bit digital 2's complement format, all the data are in 8-bit digital straight format. features ? monitor local and remote temperatures ? temperature accuracy of 2 c for local, and 3 c for remote channel ? temperature resolution of 1 c ? 2.8 v to 5.5 v supply range ? monitor different power supplies: 12 v, 5 v, 3.3 v, 2.5 v, v ccp, v dd ? v in accuracy of 2% of full scale ? differential non-linearity of 1lsb ? no calibration required ? programmable temperature and voltage limits for alarms ? programmable reset low state pulse output ? smbus 2-wire serial interface ? small 16-lead ssop package ? compatible with intel aheceta 4o specification and reference designs utilizing it applications ? system thermal and hardware monitor ? desktop computers ? notebook computers ? industrial controllers ? telecom equipment ordering information part number package drawing number NE1619ds ssop16: plastic shrink small outline package; 16 leads; body width 3.9 mm; lead pitch 0.635 mm sot519-1
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 3 pinning pin configuration 1 2 3 4 5 6 7 89 10 11 12 13 14 15 16 sda scl gnd v dd /3.3vsb vid0 vid1 vid2 vid3 a0/reset /ntest_out v ccpvin 2.5v in 3.3v in 5v in 12v in /vid4 d+ d/ntest_in sl01228 pin description pin # symbol function description 1 sda digital i/o. smbus serial bi-directional data. open-drain output. 2 scl digital input. smbus serial clock input. 3 gnd ground. to be connected to system ground. 4 v dd /3.3vsb power supply. can be connected to +3.3 v standby power if monitoring in low power states is required. this pin also serves as the analog input to monitor the v dd voltage level. 5 vid0 digital input. for voltage id readouts from the processor. this value is read into the vid status register (lsb bit). 6 vid1 digital input. for voltage id readouts from the processor. this value is read into the vid status register. 7 vid2 digital input. for voltage id readouts from the processor. this value is read into the vid status register. 8 vid3 digital input. for voltage id readouts from the processor. this value is read into the vid status register. 9 d/ntest_in analog/digital input. this pin is connected to the negative terminal of the remote temperature sensor for analog input. if this pin is held high at power-up, for digital input, it enables the nand-tree test mode. 10 d+ analog input. this pin is connected to the positive terminal of the remote temperature sensor. 11 12v in /vid4 analog/digital input. defaults at power-up to analog input for monitoring the +12 v supply. this pin is programmable to be a digital input for voltage id readouts from the processor. its state is read into the vid4 status register. 12 5v in analog input. for monitoring the +5 v supply. 13 3.3v in analog input. for monitoring the +3.3 v supply. 14 2.5v in analog input. for monitoring the +2.5 v supply. 15 v ccpvin analog input. for monitoring the processor voltage supply (0 to 3.0 v) 16 a0/reset /ntest_in digital i/o. at power-up, the logic input of this pin defines the lsb bit of the device slave address. this pin can be configured to give a low pulse reset output of 20ms minimum. this pin also functions as the output in the nandtree test mode.
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 4 functional block diagram sl01229 local temp sensor temp mux a-to-d converter voltage mux v in attenuators switch vid4 register control logic local temp rdg register remote temp rdg register vdd reading register vccp reading register 2.5 v reading register 3.3 v reading register 5 v reading register 12 v reading register configuration register local temp hl register remote temp hl register vdd hl register vccp hl register 2.5 v hl register 3.3 v hl register 5 v hl register 12 v hl register local temp ll register remote temp ll register vdd ll register vccp ll register 2.5 v ll register 3.3 v ll register 5 v ll register 12 v ll register command pointer register d+ d-/ ntest_in gnd vdd v ccvin 2.5 v in 3.3 v in 5 v in 12 v in / vid4 smbus interface scl sda vid3 vid2 vid1 vid0 address decoder and register status register 1 status register 2 company # register step version register test register reset pulse circuit vid 0-3 register ntest circuit a0/ reset / ntest_out
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 5 typical operating circuit remote sensor m p on-board pnp transistor or discrete npn transistor ground 0.1 m f 10 k w 10 k w 100 k w v dd smbus selectable a0/reset /ntest_out processor voltage id code data clock vid0 vid1 vid2 vid3 vid4 system power supplies 2.5 v 3.3 v 5.0 v 12.0 v ground v ccp see note 1 sl01230 4 2 1 16 5 6 3 11 12 13 14 15 9 10 8 7 NE1619 1. may be required in noisy environment, about 1 nf. absolute maximum ratings parameter min. max. unit v dd to gnd 0.3 6 v 12v in to gnd 0.3 18 v 5v in , 3.3v in , 2.5v in , v ccp to gnd 0.3 6 v other pins to gnd 0.3 v dd +0.3 v input current at any pin 5 5 ma package input current 20 20 ma operating temperature range 0 +120 c maximum junction temperature +150 c storage temperature range 65 +150 c
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 6 temp error vs pc board track resistance 30 25 20 15 10 5 0 5 10 15 20 1 10 100 leakage resistance (mohm) remote temp error(deg. c) from d+ pin to gnd from d+ pin to vdd sl01245 figure 1. temp error versus pc board track resistance temp error vs d+d capacitance 10 9 8 7 6 5 4 3 2 1 0 1 2.2 3.3 4.7 6.8 10 22 33 47 d+ to d capacitance (nf) temperature error (deg. c) sl01244 figure 2. temp error versus d+d capacitance standby current vs supply voltage 0 20 40 60 80 100 0123456 supply voltage (v) stdby supply current (ua) sl01243 figure 3. standby current versus supply voltage standby current vs temperature 0 10 20 30 40 50 50 25 0 25 50 75 100 125 temperatures (deg. c) stdby supply current (ua) vdd= 2.8v vdd= 3.3v vdd= 3.8v vdd = 5.0v sl01242 figure 4. standby current versus temperature
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 7 standby supply current vs sclk frequency 0 50 100 150 200 250 1k 10k 100k 1000k sclk frequency (hz) stdby supply current (ua) vdd=5v vdd=3.3v sl01246 figure 5. standby current versus sclk frequency remote temp error vs commonmode noise frequency 10 5 0 5 10 15 20 25 30 1k 10k 100k 1000k 10000k 100000k noise frequency (hz) temperature error (deg. c) noise is ac coupled to d pins noise=100mvpp noise=50mvpp sl01241 figure 6. temp error versus common mode noise noise frequency 1 0 1 2 3 4 5 6 7 8 9 10 1k 10k 100k 1000k 10000k 100000k noise frequency (hz) temperature error (deg. c) remote temp error vs differentialmode noise=10mvpp sq.wave applied between d+ & d pins sl01240 figure 7. temp error versus different mode noise frequency relationship between temperature and temp reading 0 25 50 75 100 125 0 25 50 75 100 125 temperature (deg. c) temp reading (decimal) sl01247 figure 8.
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 8 dc electrical characteristics v dd = 3.3 v, t amb = 0 c to +120 c unless otherwise specified. symbol parameter condition min. typ. max. unit v dd supply voltage 2.8 3.3 5.5 v i dd supply current standby mode 100 m a i dd supply current operating mode 250 500 m a t c total monitoring cycle time 1 all conversions 0.25 0.50 sec t r temperature resolution local and remote 1.0 c t internal tem p erature accuracy t amb = 25 c 2.0 c t ai internal temperat u re acc u rac y t amb = 0 c to +120 c 3.0 c t external tem p erature accuracy t amb = 25 c 3.0 c t ae e x ternal temperat u re acc u rac y t amb = 0 c to +120 c 5.0 c i s remote source current high level 100 m a i s remote so u rce c u rrent low level 10 m a voltage-to-digital converter (12v in , 5v in , 3.3v in , 2.5v in , v ccp , v dd ) vue unadjusted error 2.0 %fs vdnl differential non-linearity error 1.0 lsb vrin v in input resistance 100 200 k w vpss v in power supply sensitivity 1.0 %/v digital output (sda, a0 2 ) v oh output high voltage i out = 3.0 ma, v dd = 2.8 v 2.4 v v ol output low voltage i out = 3.0 ma, v dd = 3.8 v 0.4 v i oh output high leakage current v out = v dd 0.1 10.0 m a smb digital input voltages (sda, scl) v ih input high voltage 0.6v dd v v il input low voltage 0.3v dd v digital input voltages (a0, vid04, nt_in 3 ) v ih input high voltage 2.0 v v il input low voltage 0.4 v digital input current (all digital inputs) i ih input high current v in = v dd 1.0 m a i il input low current v in = gnd 1.0 m a c in input capacitance 20.0 pf notes: 1. total monitoring cycle time includes all temperature conversions and all voltage conversions. 2. when a0 is selected as output in nand-tree test mode. 3. when d is selected as input in nand-tree test mode.
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 9 smbus interface ac characteristics v dd = 3.3 v, t amb = 0 c to +120 c unless otherwise specified. symbol parameter condition min. typ. max. unit t scl scl clock frequency 400 khz t buf smbus free time 4.7 m s t low scl low time 4.7 m s t high scl high time 4.0 m s t su:sta start set-up time 100 ns t hd:sta start hold time 100 ns t su:sto stop set-up time 4.0 m s t su:dat data set-up time 250 ns t hd:dat data hold time 0 ns t f fall time 1.0 m s note: 1. these specifications are guaranteed by design and not tested in production. timing diagram sl01231 scl sda t low t high t hd:sta t hd:dat t su:dat t su:sta t su:sto t buf t f ps p s s: start condition p: stop condition
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 10 table 1. list of registers name command or address r/w por state description cr 40h r/w 0000 1000 configuration register sr1 41h read only 0000 0000 status register #1 sr2 42h read only 0000 0000 status register #2 vid 47h read only 0000 xxxx vid register, xxxx = vid3vid0 vid4 49h read only 1000 000x vid4 register, x = vid4 cid 3eh read only 1010 0001 company number sid 3fh read only 0010 0001 stepping version number test 15h r/w n/a manufacturer test register 2.5vr 20h read only n/a 2.5v in reading register vccpr 21h read only n/a v ccpvin reading register 3.3vr 22h read only n/a 3.3v in reading register 5vr 23h read only n/a 5v in reading register 12vr 24h read only n/a 12v in reading register vddr 25h read only n/a v dd reading register etr 26h read only n/a external or remote temperature reading register itr 27h read only n/a internal or local temperature reading register 2.5vhl 2bh r/w 0000 0000 2.5v in high limit register 2.5vll 2ch r/w 0000 0000 2.5v in low limit register vccphl 2dh r/w 0000 0000 v ccpvin high limit register vccpll 2eh r/w 0000 0000 v ccpvin low limit register 3.3vhl 2fh r/w 0000 0000 3.3v in high limit register 3.3vll 30h r/w 0000 0000 3.3v in low limit register 5vhl 31h r/w 0000 0000 5v in high limit register 5vll 32h r/w 0000 0000 5v in low limit register 12vhl 33h r/w 0000 0000 12v in high limit register 12vll 34h r/w 0000 0000 12v in low limit register vddhl 35h r/w 0000 0000 v ddvin high limit register vddll 36h r/w 0000 0000 v ddvin low limit register ethl 37h r/w 0000 0000 external or remote temperature high limit register etll 38h r/w 0000 0000 external or remote temperature low limit register ithl 39h r/w 0000 0000 internal or local temperature high limit register itll 3ah r/w 0000 0000 internal or local temperature low limit register
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 11 table 2. configuration register (cr, 40h, default = 0000 1000) bit name r/w description 0 start r/w logic 1 enables startup of monitor device, logic 0 places the device in standby mode. powerup default = 0. at startup, limit checking functions and scanning begins. note, all high and low limits should be set into the asic prior turning on this bit. 1 reserved read power-up default = 0. 2 reserved read power-up default = 0. 3 reserved read power-up default = 1. 4 reset r/w setting this bit generates a minimum 20ms low pulse on the reset pin, if the reset function is enabled. power-up default = 0. 5 12v in /vid4 select r/w selects whether pin 11 acts as a 12 volt analog input monitoring pin, or as a vid[4] input. this pin defaults to the 12 volt analog input. powerup default = 0. 6 reserved read powerup default = 0. 7 initialization r/w logic 1 restores powerup default values to the configuration register and the status registers. this bit automatically clears itself. powerup default = 0. table 3. status register 1 (sr1, 41h, default = 0000 0000) bit name r/w description 0 +2.5v_error read a one indicates 2.5v in high or low limit has been exceeded. 1 vccp_error read a one indicates v ccpvin high or low limit has been exceeded. 2 +3.3v_error read a one indicates 3.3v in high or low limit has been exceeded. 3 +5v_error read a one indicates 5v in high or low limit has been exceeded. 4 internal temp error read a one indicates internal or local temp high or low limit has been exceeded. 5 external temp error read a one indicates external or remote temp high or low limit has been exceeded. 6 reserved read 7 reserved read table 4. status register 2 (sr2, 42h, default = 0000 0000) bit name r/w description 0 +12v_error read a one indicates 12v in high or low limit has been exceeded. 1 vdd_error read a one indicates v dd high or low limit has been exceeded. 2 reserved read undefined. 3 reserved read undefined. 4 reserved read undefined. 5 reserved read undefined. 6 remote diode fault read a one indicates either a short or open circuited fault on the remote thermal diode inputs. 7 reserved read undefined. table 5. vid (vid, 47h, default = 0000 vid[3:0] ) bit name r/w description 03 vid[0:3] read the vid[0:3] inputs from pentium/pro power supplies id to indicate the operating voltage (e.g. 1.5v to 2.9v). power-up default = vid[0:3]. 46 reserved read undefined. 7 reset enable read when set to 1, enables the reset pin output function. this bit defaults to 0 at powerup and enables addressing function. table 6. vid4 (vid4, 49h, default = 1000 000vid[4] ) bit name r/w description 0 vid4 read vid4 input, if selected, from pentium/pro power supplied id. power-up default = 0 and pin 11 is not selected for vid4. 17 reserved read power-up default = 1000 000
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 12 functional description smbus serial interface the NE1619 can be connected to a compatible 2-wire serial interface smbus as a slave device under the control of a master device or controller, using two device terminals scl and sda. the controller will provide a clock signal to the device scl pin and write/read data to/from the device through the sda pin. data of 8-bit digital byte or word are used for communication between the controller and the device. notice that external pull-up resistors, about 10 k w , are needed for the two terminals scl and sda. slave address the NE1619 slave address on the smbus is defined by the hardware connection applied to the device pin 16. at power-up this pin is automatically reset to its address sensing function a0. this logic input will set up the value of the lsb bit of the 7-bit address. because a0 is a two-level digital input and the other 6 bits of the address are predefined to 010110, only two slave addresses can be used as listed below for the device: table 7. a0 connection (pin 16) slave address gnd 0101100 v dd 0101101 because the logic is sampled and latched into the device storage only at power-up, the device pin 16 can be programmed for different functions while power is on without effecting the address definition. registers the NE1619 contains a number of registers, as listed in table 1, in order to store data of the device setup and operation results. the table indicates the command value and read/write capability of each register for smbus communication and also the power-up default values for some registers. it includes: configuration register to provide control and configuration as well as initialization the NE1619, status registers to provide the flags resulting from limit comparisons, reading registers to store results of measurements, limit registers to store programmable limit data, id and test registers. data are stored in registers by 8-bit digital byte, either in 2's complement format for temperature-related data or in straight format for others. writing and reading registers will be done on the smbus by a controller using the smbus protocols that will be described more in the last section of this functional description. notice that attempting to write to a aread onlyo register will produce an invalid result. power-on reset when the power is applied to the NE1619, also called hardware reset, the registers are reset to their default value, if defined, as shown in table 1. the content of registers which have indeterminate default value such as reading registers will be unknown. the on-board a-to-d converter is disabled and the monitoring function is not started. the device enters standby mode and draws a supply current less than 100 m a. because all limit registers are reset to zero, writing limits into the limits registers should usually be the first action to be performed after power-on reset. initialization initialization or software reset of the NE1619 can be initiated by setting bit 7 of the configuration register. this bit automatically clears itself after being set. the initialization performs a similar reset function to power-on reset, except that the reading and limit registers are not reset. starting conversion the NE1619 monitoring function is started by setting (to 1) the start bit (bit 0) of the configuration register. the device then performs a loop of monitoring about every second. in monitoring function, the device cycles sequentially through all measurements of temperatures and voltages and also performs the comparisons between readings and limits accordingly. the inputs are sampled in this order: remote diode temperature, local temperature, v dd v in , 12v in , 5v in . 3.3v in, 2.5v in and v ccpvin . measured values are stored in reading registers and results of limit comparison are reflected by the state of the flag bits in the status registers. reading and status data can be read at any time. limit values should be written into limit registers before starting conversion to avoid false conditions of the status. resetting (to 0) the start bit (bit 0) of the configuration register will stop the monitoring function and put the device into its standby mode thereby reducing power consumption. temperature measurement the NE1619 contains an on-chip temperature sensor to measure the local or internal temperature and provides input pins (d and d+) to measure the remote or external temperature with the use of a remote diode-type sensor. the remote sensor should be connected to the d and d+ pins properly. the method of temperature measurement is based on the change of the diode vbe at two different operating current levels given by: d vbe = (kt/q)*ln(n) where: k: boltzmann's constant t: absolute temperature in k q: charge on the electron n: ratio of the two currents ln: natural logarithm the NE1619 provides two current sources of about 10 m a and 100 m a during the measurement of the remote diode vbe and the sensed voltage between two pins d and d+ is limited within 0.25 v and 0.95 v. the external diode should be selected to meet this current and voltage requirements. the diode-connected pnp transistor provided on the pentium series microprocessor is typically used, or the discrete diode-connected transistor 2n3904 is recommended. for temperature measurement, local or remote, the d vbe is converted into digital data by the on-chip sigma-delta a-to-d converter. the result is stored in the temperature reading register and is also compared with the limits stored in the temperature limit registers in order to set the temperature flag bits in the status register as described in table 3.
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 13 temperature data is represented by a digital 8-bit byte or word in two's complement format with a resolution of 1 c. theoretically, the temperature value can be from 128 c to +127 c but, practically, the operation range is limited to (0 c, 120 c). here are some of temperature values and data: table 8. temperature value ( c) temperature data +127 0111 1111 +126 0111 1110 +100 0110 0100 +25 0001 1001 +1 0000 0001 0 0000 0000 1 1111 1111 25 1110 0111 50 1100 1110 voltage measurement the NE1619 provides 5 analog inputs for directly monitoring the power supplies typically found in a pc, having nominal values of +2.5 v, +3.3 v, +5.0 v, +12.0 v and v ccp (2.25 v). the device also monitors its own v dd which nominal value is 3.3 v. notice that, at power-up, the device pin 11 is defaulted to its 12v in function. these inputs are internally attenuated by on-chip resistor networks to the reference levels that are then multiplexed to a 8-bit delta-sigma a-to-d converter for converting into digital data. each v in input is overall scaled in such a way that the decimal value of the data for its nominal voltage value is equal to 192. it means that the overall step size of the conversion for each v in is equal to 1 / 192 of its nominal value. reading data are stored in the v in reading registers and are also compared with the limits stored in the v in limit registers in order to set the voltage flag bits in the status registers as described in tables 3 and 4. the v in data, different with the temperature data, is represented by a digital 8-bit byte or word in straight format with a resolution lsb equal to 1 / 192 of the nominal value, and has any value from 0 to 255. this is how to calculate the v in error from the v in reading at any input including v dd : resolution in volts: lsb = (v in nominal in volt)/192 full scale in volts: fs= 255 * lsb reading value in volts: v in value = (decimal value of v in reading) * lsb reading error in volts: v in error = (v in value) (v in applied) vin error in % of fs: v in error % = 100*(v in error)/fs applied value < 0 results in a reading of about 0 applied value > fs results in a reading of about 255 input safety since the power supply voltages will appear directly at v in pins, a small external resistor, about 500 w , should be connected in series with each pin in order to prevent damaging the power supplies due to accidental short. these resistors are recommended but not necessary. no external resistor-divider should be used for the v in pins because of the effect of the internal input resistors, about 140 k w at each pin, on the divider accuracy. processor voltage id (vid) the NE1619 provides 5 digital pins (vid0vid4) to read the processor voltage id code and store it into the vid registers so that the code can be read over the smbus: vid register: bit 0bit3 reflect vid0vid3 respectively vid4 register: bit 0 reflects vid4 because the vid4 function of 12v in /vid4 pin (pin 11) is not selected at power-up (default function of this pin is 12v in ), the process of selecting this pin must be performed, if vid4 is needed, by setting (to 1) bit 5 (12v in /vid4 select) of the configuration register. the default value of bit 0 of the vid4 register is 0. the vid inputs should not be left floating because they are not internally biased. if they are not used then they should be connected to either gnd or v dd with resistors. limit data high and low limits for temperatures and voltages should be programmed into the limit registers using the format as described above. during monitoring cycle, the measured data is automatically compared with the limits and flag bits in the status registers are set accordingly to the results. the assignment of the status bits are listed in tables 3 and 4. status registers results of limits comparisons are reflected by status or flag bits stored in the status register 1 and 2. if the reading is within the limits then the corresponding flag bit will be cleared to 0. otherwise, it will be set to 1. status data can be read over the smbus. notice that because the flag bits are automatically updated at every monitoring cycle, their states only reflect the last measurements. diode fault status the hardware connection at the diode pins (d+ and d) are also checked at the measurement of external temperature and the fault condition is indicated by the flag bit 6 of the status register 2. this bit is set to 1 if either short or open circuit fault is detected. reset output function the NE1619 pin 16 can be selected as a reset pulse output. when this function is selected and the reset pulse is initiated, this pin will output a single (minimum 20 ms) low state pulse. the reset output function is selected by setting (to 1) the reset enable bit (bit 7) of the vid register. thereafter, the reset pulse is generated whenever the reset bit (bit 4) of the configuration register is programmed to change from 0 to 1. because pin 16 becomes an open-drain output when it is selected as an output, an external pull-up resistor, about 100 k w is needed for the output operation. this will restrict the address function on pin 16 to being high at power-up. therefore, if multiple NE1619's are connected on the same bus, only one can have this function enabled at one time.
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 14 nand-tree test a nand tree is provided in the NE1619 for automated test equipment (ate) board level connectivity testing. the device is placed into nand tree test mode by powering up with pin 9 (d/ntest_in) held high. in this test mode pin 16 (a0/reset /ntest_out) becomes the nand-tree output and all input pins become nand-tree inputs as illustrated in figure 1. to perform a nand tree test all pins should be initially driven low. then one-by-one toggle them high (and keep them high), starting with the input closest to the output, cycling toward the farthest, the nand tree output will toggle with each input change. sl01232 sda scl vid4 vid0 vid1 vid2 vid3 ntest_out figure 1. nand-tree circuitry table 9. nand-tree test vectors vector # sda scl vid0 vid1 vid2 vid3 vid4 ntest_out 1 l l l l l l l h 2 l l l l l l h l 3 l l l l l h h h 4 l l l l h h h l 5 l l l h h h h h 6 l l h h h h h l 7 l h h h h h h h 8 h h h h h h h l
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 15 smbus interface protocol the NE1619 can communicate over a compatible 2-wire serial interface smbus using the two device pins scl and sda. the device employs three standard smbus protocols: write byte, read byte and receive byte. data formats of those protocols are shown below with following notices: ? the smbus controller initiates data transfer by establishing a start condition (s) and terminates data transfer by generating a stop condition (p). ? data is sent over the serial bus in sequence of 9 clock pulses for each 8-bit data byte followed by 1-bit status of the device acknowledgement (a). ? the 7-bit slave address is replaced by the selected address of the device. ? the command byte is replaced by the selected command of the device register. ? the receive byte format is used for quickly transfer data from a reading register which was previously selected by a read. ? during the transition between start and stop conditions, data must be stable and valid when the scl is high. sl01233 scl sda scl (continued) sda (continued) scl sda scl (continued) sda (continued) scl sda restart device address device register command data to be written to register data from device register (end) device address device address device address data from device register data register command stop stop 123456789123456789 123456789123456789 123456789123456789 123456789123456789 (to next) (to next) (to next) (to next) 123456789 010110a0 d7d6d5d4d3d2d1d0 d7 d6 d5 d4 d3 d2 d1 d0 010110a0 010110a0 swa a ap swa ap sra nap sra nap d7 d6 d5 d4 d3 d2 d1 d0 d7 d6 d5 d4 d3 d2 d1 d0 0 1 0 1 1 0 a0 d7 d6 d5 d4 d3 d2 d1 d0 receive byte format: read byte format: write byte format: figure 2. NE1619 smbus interface protocols
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 16 ssop16: plastic shrink small outline package; 16 leads; body width 3.9 mm; lead pitch 0.635 mm sot519-1
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 17 notes
philips semiconductors product data NE1619 heceta4 temperature and voltage monitor 2001 aug 29 18 definitions short-form specification e the data in a short-form specification is extracted from a full data sheet with the same type number and title. for detailed information see the relevant data sheet or data handbook. limiting values definition e limiting values given are in accordance with the absolute maximum rating system (iec 60134). stress above one or more of the limiting values may cause permanent damage to the device. these are stress ratings only and operation of the dev ice at these or at any other conditions above those given in the characteristics sections of the specification is not implied. exposure to limi ting values for extended periods may affect device reliability. application information e applications that are described herein for any of these products are for illustrative purposes only. philips semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. disclaimers life support e these products are not designed for use in life support appliances, devices or systems where malfunction of these products can reasonably be expected to result in personal injury. philips semiconductors customers using or selling these products for use i n such applications do so at their own risk and agree to fully indemnify philips semiconductors for any damages resulting from such application. right to make changes e philips semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. philips semiconductors ass umes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or m ask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right in fringement, unless otherwise specified. contact information for additional information please visit http://www.semiconductors.philips.com . fax: +31 40 27 24825 for sales offices addresses send e-mail to: sales.addresses@www.semiconductors.philips.com . ? koninklijke philips electronics n.v. 2001 all rights reserved. printed in u.s.a. date of release: 09-01 document order number: 9397 750 08874

data sheet status [1] objective data preliminary data product data product status [2] development qualification production definitions this data sheet contains data from the objective specification for product development. philips semiconductors reserves the right to change the specification in any manner without notice. this data sheet contains data from the preliminary specification. supplementary data will be published at a later date. philips semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product. this data sheet contains data from the product specification. philips semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. changes will be communicated according to the customer product/process change notification (cpcn) procedure snw-sq-650a. data sheet status [1] please consult the most recently issued data sheet before initiating or completing a design. [2] the product status of the device(s) described in this data sheet may have changed since this data sheet was published. the l atest information is available on the internet at url http://www.semiconductors.philips.com.

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